This paper presents an equivalent self-consistent electrothermal circuit model for power integrity analysis of large on-chip power distribution networks. Two coupled circuits are used to co-simulate the electrical and thermal behavior of the power grid. After a steady-state analysis, the order of the circuit is strongly reduced by means of a node clustering technique. The obtained low-order circuit allows a cost-effective complete power integrity analysis, including dynamic analysis and evaluation of time-domain features like voltage droop. As a case-study, a 45-nm chip power grid is analyzed: the full circuit for the electrothermal model with 4 million nodes is reduced by a factor of about 3500×, with a relative error on the solution below few percent.

A clustering technique for fast electrothermal analysis of on-chip power distribution networks

DE MAGISTRIS, MASSIMILIANO;
2016-01-01

Abstract

This paper presents an equivalent self-consistent electrothermal circuit model for power integrity analysis of large on-chip power distribution networks. Two coupled circuits are used to co-simulate the electrical and thermal behavior of the power grid. After a steady-state analysis, the order of the circuit is strongly reduced by means of a node clustering technique. The obtained low-order circuit allows a cost-effective complete power integrity analysis, including dynamic analysis and evaluation of time-domain features like voltage droop. As a case-study, a 45-nm chip power grid is analyzed: the full circuit for the electrothermal model with 4 million nodes is reduced by a factor of about 3500×, with a relative error on the solution below few percent.
2016
9781509003495
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11367/84367
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