The aim of this paper is to analyse the pattern of knowledge flows as evidenced by the patent citations in three economic areas: USA, Japan and Europe. In each economic area, we exploit information from two international patent offices data, the United States Patent and Trademarks Office (USPTO) data and the European Patent Office (EPO) data. In this way, we can investigate the link between the technological prox- imity and knowledge spillovers for 240 international firms. In particular, the contri- bution to the existing literature is twofold: First, we use an international sample so that we can compare the empirical results among different economic markets; second, we explore the robustness of results with respect to patent system features. In order to compute the technological proximity, we consider both the symmetrical measure and asymmetrical one. The empirical results indicate that there is a statistically significant correlation between technological proximity and knowledge spillovers measured by patent citations and that these results are robust with respect to patent office data used in the analysis.

Technological spillovers through a patent citation analysis

ALDIERI, Luigi;
2015

Abstract

The aim of this paper is to analyse the pattern of knowledge flows as evidenced by the patent citations in three economic areas: USA, Japan and Europe. In each economic area, we exploit information from two international patent offices data, the United States Patent and Trademarks Office (USPTO) data and the European Patent Office (EPO) data. In this way, we can investigate the link between the technological prox- imity and knowledge spillovers for 240 international firms. In particular, the contri- bution to the existing literature is twofold: First, we use an international sample so that we can compare the empirical results among different economic markets; second, we explore the robustness of results with respect to patent system features. In order to compute the technological proximity, we consider both the symmetrical measure and asymmetrical one. The empirical results indicate that there is a statistically significant correlation between technological proximity and knowledge spillovers measured by patent citations and that these results are robust with respect to patent office data used in the analysis.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11367/50137
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